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  3. foundry-ml/electromigration_v1-1

foundry-ml

electromigration_v1-1

Electromigration data for interconnect materials — supports ML prediction of failure rates in microelectronic devices.

Original source
Rows
49
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2.3 kB
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26

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Updated
Dec 28

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  • default/train

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Provenance

Licence
cc-by-4.0
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0

Fields

Materials ScienceEngineering
tabular-regressiontabular-classification